Menu
Bruker's SmartTip™ CIPT solutions offer several high-field, high-accuracy instruments for both industry and academia to perform current-in-plane tunneling measurements. Both in-plane and perpendicular field options are available.
Driven by a mission to provide innovative solutions to our customers, we aim to enable MEMS-based microprobe technologies through co-operation and collaboration with our customers. Our SmartTip solutions are positioned to advance high-tech nanotechnology-based microprobe applications with a commitment to quality and continuous improvement in development.
